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2017-06-13
WIP Standard
AS6171/22
To define capabilities and limitations of SEM-EDS as it pertains to counterfeit detection of EEE parts and suggest possible applications to these ends. Additionally, this document outlines requirements associated with the application of SEM-EDS including: Operator training; Sample preparation; Data interpretation; Equipment maintenance; and Reporting of data. If SAE AS6171/22 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
2017-06-12
WIP Standard
AS6171A

This SAE Aerospace Standard (AS) standardizes inspection and test procedures, workmanship criteria, and minimum training and certification requirements to detect Suspect/Counterfeit (SC) Electrical, Electronic, and Electromechanical (EEE) parts. The requirements of this document apply once a decision is made to use parts with unknown chain of custody that do not have pedigree back to the original component manufacturer, or have been acquired from a broker or independent distributor, or when there are other known risk elements that result in the User/Requester to have concerns about potential SC EEE parts. The tests specified by this standard may also detect occurrences of malicious tampering, although the current version of this standard is not designed specifically for this purpose.

CURRENT
2017-05-11
Standard
AS6171/2A
This document describes the requirements of the following test methods for counterfeit detection of electronic components: Method A: General EVI, Sample Selection, and Handling Method B: Detailed EVI, including Part Weight measurement Method C: Testing for Remarking Method D: Testing for Resurfacing Method E: Part Dimensions measurement Method F: Surface Texture Analysis using SEM The scope of this document is focused on leaded electronic components, microcircuits, multi-chip modules (MCMs), and hybrids. Other EEE components may require evaluations not specified in this procedure. Where applicable this document can be used as a guide. Additional inspections or criteria would need to be developed and documented to thoroughly evaluate these additional part types. If SAE AS6171/2 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
2017-05-09
WIP Standard
AS6174/3
This document standardizes requirements for bearings: (a) supply chain management, procurement, inspection, parts management, and test/evaluation to assure the authenticity of bearings being acquired/used, and (b) response strategies when suspect or confirmed counterfeit bearings are discovered. Though developed primarily for critical application bearings, the document also may be applicable, at the discretion of the user, to other bearings with similar characteristics and applications. The bearings slash sheet is not intended to replace, conflict with, or duplicate requirements in quality system or AMS series material specs but rather to augment them with regards to counterfeit prevention and risk mitigation.
CURRENT
2017-04-11
Standard
AS6174/1
To assure compliance to AS6174A requirements, a set of standard assessment verification criteria is utilized to evaluate and establish uniform compliance assessment. This document standardizes verification compliance criteria for AS6174A requirements.
2017-03-02
WIP Standard
ARP1962B
This document requires that the company (facility) employing the personnel ensure a verifiable program of on-the-job training, experience, education, classroom instruction, and evaluation of personnel using either company-created programs or programs described herein. It describes the requirements for training and approval of personnel performing certain heat-treating and associated operations. It also establishes that only approved personnel may perform or monitor the functions listed for the processes and materials listed.
2017-02-01
WIP Standard
AS6171/4A
This method standardizes inspection, test procedures and minimum training and certification requirements to detect Suspect/Counterfeit (SC) Electrical, Electronic, and Electromechanical (EEE) components or parts utilizing Delid/Decapsulation Physical Analysis. The methods described in this document are employed to either delid or remove the cover from a hermetically sealed package or to remove the encapsulation or coating of an EEE part, in order to examine the internal structure and to determine if the part is suspect counterfeit. Information obtained from this inspection and analysis may be used to: a. prevent inclusion of counterfeit parts in the assembly b. identify defective parts c. aid in disposition of parts that exhibit anomalies This test method should not be confused with Destructive Physical Analysis as defined in MIL-STD-1580. MIL-STD-1580 describes destructive physical analysis procedures for inspection and interpretation of quality issues.
CURRENT
2017-01-18
Standard
J2305_201701
This SAE standard applies to horizontal earthboring machines (SAE J2022) of the following types: Auger boring machines; Rod pushers; Rotary rod machines; Impact machines. This document does not apply to specialized horizontal directional drills, mining machines, conveyors, tunnel boring machines, pipe jacking systems, micro tunnelers, or well drilling machines.
2017-01-18
WIP Standard
AS5553C
This standard is for use by organizations that procure and/or integrate EEE parts and/or assemblies containing such items. The requirements of this standard are generic and intended to be applied/flowed down, as applicable, through the supply chain to all organizations that procure EEE parts and/or assemblies, regardless of type, size, and product provided. The mitigation of counterfeit EEE parts in this standard is risk-based and these mitigation steps will vary depending on the application, desired performance, and reliability of the equipment/hardware. The requirements of this document are intended to supplement the requirements of a higher level quality standard (e.g., AS/EN/JISQ9100, ISO-9001, ANSI/ASQC E4, ASME NQA-1, AS9120, AS9003, and ISO/TS 16949 or equivalent) and other quality management system documents.
2016-12-09
WIP Standard
AS6171/21
This document defines capabilities and limitations of Gas Chromatography/Mass Spectrometry (GC/MS) as it pertains to detection of suspect/counterfeit EEE parts and suggests possible applications to these ends. Additionally, this document outlines requirements associated with the application of GC/MS including: operator training; sample preparation; various sampling techniques; data interpretation; computerized spectral matching; equipment maintenance; and reporting of data. The discussion is limited to unit mass resolution spectrometers such as quadrupole systems and electron impact ionization.
2016-12-09
WIP Standard
AS6171/20
To define capabilities and limitations of X-Ray Photoelectron Spectroscopy (XPS) as it pertains to detection of suspect/counterfeit EEE parts and suggest possible applications to these ends. Additionally, this document outlines requirements associated with the application of XPS including: operator training and requirements; sample preparation; data interpretation; and data reporting procedures.
2016-12-09
WIP Standard
AS6171/18
This test method provides the capabilities, limitations, and suggested possible applications of TMA as it pertains to detection of suspect/counterfeit EEE parts. Additionally, this document outlines requirements associated with the application of TMA including: equipment requirements, test sample requirements, methodology, control and calibration, data analysis, reporting, and qualification and certification.
2016-12-09
WIP Standard
AS6171/19
This document defines capabilities and limitations of Auger Electron Spectroscopy (AES) as it pertains to detection of suspect/counterfeit EEE parts and suggests possible applications to these ends. Additionally, this document outlines requirements associated with the application of AES including: operator training and requirements; sample preparation; data interpretation and reporting of data.
CURRENT
2016-11-08
Standard
TB0003A
This Technical Bulletin covers the following areas of concern. Prevention: Actions recommended for procuring parts and materials with a full warranty; Actions recommended for minimizing risks and protecting your Program from counterfeiting; Actions recommended when buying from a non-authorized supplier. Detection: Actions recommended when procuring parts from an unauthorized supplier or otherwise suspect that a part or material at risk of being counterfeit has been procured. Risk Mitigation: Actions recommended when no reasonable alternatives exist (e.g., a redesign is required, an unacceptable schedule delay will result, the program or customer cannot bear the additional cost) and the decision has been made to procure from a non-authorized supplier.
CURRENT
2016-11-08
Standard
ARP9136
The objective of any organization, as part of continual improvement, is to reduce the number of issues (i.e., undesirable conditions, defects, failures) and to minimize their impact on quality, delivery performance, and cost. This includes having processes in place to detect and eradicate significant and recurrent issues, which implies having well identified problems, a common understanding of their impact and associated root causes, and having defined and implemented adequate actions so that these problems, including similar issues will not happen again.
CURRENT
2016-10-30
Standard
AS6171/7
The scope of this document is to: Specify techniques to detect SC parts using electrical testing. Provide various levels of electrical testing that can be used by the User to define test plans for detecting SC parts. Provide minimum requirements for testing laboratories so that User/Requester can determine which test houses have the necessary capabilities. (For example: technical knowledge, equipment, procedures and protocols for performing electrical testing for verification analysis.) Note: User/Requester is defined in AS6171 General Requirements Specify Burn-In and environmental tests. The environmental tests include Temperature Cycling for Active Devices and Thermal Shock for Passive Devices. Seal Tests are described and recommended for hermetic devices. The following terminology is used throughout this document: Shall = is mandatory; Should = is recommended; and Will = is planned (is considered to be part of a standard process).
CURRENT
2016-10-30
Standard
AS6171/8
To define capabilities and limitations of Raman spectroscopy as it pertains to counterfeit detection of EEE parts and suggest possible applications to these ends. Additionally, this document outlines requirements associated with the application of Raman spectroscopy including: Operator training; Sample preparation; Data interpretation; Computerized spectral matching including pass/fail criteria; Equipment maintenance and; Reporting of data. If AS6171/8 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
CURRENT
2016-10-30
Standard
AS6171/5
The intent of this document is to define the methodology for suspect parts inspection using radiological inspection. The purpose of radiology for suspect counterfeit part inspection is to detect deliberate misrepresentation of a part, either at the part distributor or original equipment manufacturer (OEM) level. Radiological inspection can also potentially detect unintentional damage to the part resulting from improper removal of part from assemblies, which may include, but not limited to, prolonged elevated temperature exposure during desoldering operations or mechanical stresses during removal. Radiological inspection of electronics includes film radiography and filmless radiography such as digital radiography (DR), real time radiography (RTR), and computed tomography (CT). Radiology is an important tool used in part verification of microelectronic devices.
CURRENT
2016-10-30
Standard
AS6171/6
Through the use of ultra-high frequency ultrasound, typically above 10 MHz, Acoustic Microscopy (AM) non-destructively finds and characterizes physical features and latent defects (visualization of interior features in a layer by layer process) - such as material continuity and discontinuities, sub-surface flaws, cracks, voids, delaminations and porosity. AM observed features and defects can be indicators that the components were improperly handled, stored, altered or previously used. If AS6171/6 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
CURRENT
2016-10-30
Standard
AS6171/4
This method standardizes inspection, test procedures and minimum training and certification requirements to detect Suspect/Counterfeit (SC) Electrical, Electronic, and Electromechanical (EEE) components or parts utilizing Delid/Decapsulation Physical Analysis. The methods described in this document are employed to either delid or remove the cover from a hermetically sealed package or to remove the encapsulation or coating of an EEE part, in order to examine the internal structure and to determine if the part is suspect counterfeit. Information obtained from this inspection and analysis may be used to: prevent inclusion of counterfeit parts in the assembly identify defective parts aid in disposition of parts that exhibit anomalies This test method should not be confused with Destructive Physical Analysis as defined in MIL-STD-1580. MIL-STD-1580 describes destructive physical analysis procedures for inspection and interpretation of quality issues.
CURRENT
2016-10-30
Standard
AS6171/3
XRF technique for counterfeit detection is applicable to electrical, electronic and electromechanical (EEE) parts as listed in AS6171 General Requirements. In general, the detection technique is meant for use on piece parts prior to assembly on a circuit board or on the parts that are removed from a circuit board. The applicability spans a large swath of active, passive and electromechanical parts. If AS6171/3 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
HISTORICAL
2016-10-30
Standard
AS6171/2
This document describes the requirements of the following test methods for counterfeit detection of electronic components: Method A: General External Visual Inspection (EVI), Sample Selection, and Handling Method B: Detailed EVI Method C: Testing for Remarking and Resurfacing Method D: Surface Texture Analysis by SEM
CURRENT
2016-10-30
Standard
AS6171/11
This method outlines the requirements, capabilities, and limitations associated with the application of Design Recovery for the detection of counterfeit electronic parts including: Operator training; Sample preparation; Imaging techniques; Data interpretation; Design/functional matching; Equipment maintenance and; Reporting of data. The method is primarily aimed at analyses performed by circuit delayering and imaging with a scanning electron microscope or optical microscope; however, many of the concepts are applicable to other microscope and probing techniques to recover design data. The method is not intended for the purpose of manufacturing copies of a device, but rather to compare images or recover the design for determination of authenticity. If AS6171/11 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
CURRENT
2016-10-30
Standard
AS6171/10
This test method provides the capabilities, limitations, and suggested possible applications of TGA as it pertains to the detection of counterfeit electronic components. Additionally, this document outlines requirements associated with the application of TGA including: equipment requirements, test sample requirements, methodology, control and calibration, data analysis, reporting, and qualification and certification. If AS6171/10 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
CURRENT
2016-10-30
Standard
AS6171
This SAE Aerospace Standard (AS) standardizes inspection and test procedures, workmanship criteria, and minimum training and certification requirements to detect Suspect/Counterfeit (SC) Electrical, Electronic, and Electromechanical (EEE) parts. The requirements of this document apply once a decision is made to use parts with unknown chain of custody that do not have pedigree back to the original component manufacturer, or have been acquired from a broker or independent distributor, or when there are other known risk elements that result in the User/Requester to have concerns about potential SC EEE parts. The tests specified by this standard may also detect occurrences of malicious tampering, although the current version of this standard is not designed specifically for this purpose. This standard ensures consistency across the supply chain for test techniques and requirements based on assessed risk associated with the application, component, supplier, and other relevant risk factors.
CURRENT
2016-10-30
Standard
AS6171/1
This document describes an assessment of the effectiveness of a specified test plan used to screen for counterfeit parts. The assessment includes the determination of the types of defects detected using a specified test plan along with the related counterfeit type coverage. The output of this evaluation will produce Counterfeit Defect Coverage (CDC), Counterfeit Type Coverage (CTC), Not-Covered Defects (NCDs), and Under-Covered Defects (UCDs). This information will be supplied to the test laboratory’s customer in both the test report and the Certificate of Quality Conformance (CoQC). This evaluation method does not address the effectiveness of detecting tampered type devices. The Test Evaluation Method also describes an Optimized Test Sequence Selection, in which a test sequence is selected that maximizes the CDC utilizing test cost and time as constraints, for any tier level except the Critical Risk Level. The constraints can be adjusted until the desired CDC is achieved.
2016-09-29
WIP Standard
ARP6328A

This document contains guidance for implementing a counterfeit mitigation program in accordance with AS5553.

The information contained in this document is intended to supplement the requirements of a higher level quality standard (e.g., AS9100) and other quality management system documents. This is not intended to stand alone, supersede, or cancel requirements found in other quality management system documents, requirements imposed by contracting authorities, or applicable laws and regulations unless an authorized exemption/variance has been obtained.

2016-09-28
WIP Standard
AIR6860
This document explains how industry standard SAE AS5553 supports implementation of DFARS 252-246-7007 using a practical cost effective and risk based approach
CURRENT
2016-09-12
Standard
ARP6328
This document contains guidance for implementing a counterfeit mitigation program in accordance with AS5553. The information contained in this document is intended to supplement the requirements of a higher level quality standard (e.g., AS9100) and other quality management system documents. This is not intended to stand alone, supersede, or cancel requirements found in other quality management system documents, requirements imposed by contracting authorities, or applicable laws and regulations unless an authorized exemption/variance has been obtained.
CURRENT
2016-09-12
Standard
AS5553B
This standard is for use by organizations that procure and/or integrate EEE parts and/or assemblies containing such items. The requirements of this standard are generic and intended to be applied/flowed down, as applicable, through the supply chain to all organizations that procure EEE parts and/or assemblies, regardless of type, size, and product provided. The mitigation of counterfeit EEE parts in this standard is risk-based and these mitigation steps will vary depending on the application, desired performance, and reliability of the equipment/hardware. The requirements of this document are intended to supplement the requirements of a higher level quality standard (e.g., AS/EN/JISQ9100, ISO-9001, ANSI/ASQC E4, ASME NQA-1, AS9120, AS9003, and ISO/TS 16949 or equivalent) and other quality management system documents.
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