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The body of the vehicle you?re driving may be held together with more glue than welds. In this episode of SAE Eye on Engineering, Editor-In-Chief Lindsay Brooke looks at joining dissimilar materials with industrial adhesives. SAE Eye on Engineering also airs Monday mornings on WJR 760 AM Detroit's Paul W. Smith Show.
Micro-pitting is a fatigue effect that occurs in geared transmission systems due to high contact stress, and monitoring its progression is vital to prevent the eventual failure of the tooth flank. Parameter signature analysis has been successfully used to monitor bending fatigue failure and advanced phases of gear surface fatigue failure such as macro-pitting and scuffing. However, due to modern improvements in steel production the main cause of gear contact fatigue failure can be attributed to surface micro-pitting rather than sub-surface phenomena. Responding to the consequent demand to detect and monitor the progression of micro-pitting, this study experimentally evaluated the development of micro-pitting in spur gears using vibration and oil debris analysis. The paper presents the development of an online health monitoring system for use with back-to-back gear test rigs.
Moir� method is useful to measure the shape and the whole-field distributions of displacement and strain of structures. There are many kinds of moir� methods such as geometric moir� method, sampling moir� method, Fourier transform moir� method, moir� interferometry, shadow moir� method and moir� topography. Grating method analyzing directly deformation of a grating without any moir� fringe pattern is considered as an extended technique of moire method. Phase analysis of the moire fringe patterns and the grating patterns provides accurate measurements of shapes or displacement and strain distributions. Some applications of these moir� methods and grating methods to dynamic shape and strain distribution measurements of a rotating tire, sub-millimeter displacement measurements from long distance for landslide prediction, real-time shape measurements with micro-meter order accuracy, etc. are shown. Presenter Yoshiharu Morimoto, Moire Institute Inc.
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