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CURRENT
2017-05-24
Standard
AIR5742A
The scope of this document is related to the particular needs of oxygen equipment with regards to packaging and transportation. The document provides guidance for handling chemical, gaseous and liquid oxygen equipment. It summarizes national and international regulations to be taken into account for transportation on land, sea and air and provides information on classification of hazardous material. The aim of this document is to summarize information on packaging and transportation of oxygen equipment. Statements and references to regulations cited herein are for information only and should not be considered as interpretation of a law. Processes to maintain cleanliness of components and subassemblies during processing and assembly or storage of work-in-progress are outside the scope of this document. Guidance on this can be obtained from ARP1176.
CURRENT
2017-05-11
Standard
AS6171/2A
This document describes the requirements of the following test methods for counterfeit detection of electronic components: Method A: General EVI, Sample Selection, and Handling Method B: Detailed EVI, including Part Weight measurement Method C: Testing for Remarking Method D: Testing for Resurfacing Method E: Part Dimensions measurement Method F: Surface Texture Analysis using SEM The scope of this document is focused on leaded electronic components, microcircuits, multi-chip modules (MCMs), and hybrids. Other EEE components may require evaluations not specified in this procedure. Where applicable this document can be used as a guide. Additional inspections or criteria would need to be developed and documented to thoroughly evaluate these additional part types. If SAE AS6171/2 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
2017-05-09
WIP Standard
AS6174/3
This document standardizes requirements for bearings: (a) supply chain management, procurement, inspection, parts management, and test/evaluation to assure the authenticity of bearings being acquired/used, and (b) response strategies when suspect or confirmed counterfeit bearings are discovered. Though developed primarily for critical application bearings, the document also may be applicable, at the discretion of the user, to other bearings with similar characteristics and applications. The bearings slash sheet is not intended to replace, conflict with, or duplicate requirements in quality system or AMS series material specs but rather to augment them with regards to counterfeit prevention and risk mitigation.
CURRENT
2017-05-09
Standard
EIASTD4899C
This document applies to the development of Plans for integrating and managing electronic components in equipment for the military and commercial aerospace markets; as well as other ADHP markets that wish to use this document. Examples of electronic components, as described in this document, include resistors, capacitors, diodes, integrated circuits, hybrids, application specific integrated circuits, wound components, and relays. It is critical for the Plan owner to review and understand the design, materials, configuration control, and qualification methods of all “as-received” electronic components, and their capabilities with respect to the application; identify risks, and where necessary, take additional action to mitigate the risks. The technical requirements are in Clause 3 of this standard, and the administrative requirements are in Clause 4.
2017-04-20
WIP Standard
AS9104/1A
These requirements are applicable to IAQG global sectors when utilizing Aerospace Industry Controlled Other Party (ICOP) schemes for the assessment and certidication of supplier quality systems in accordance with the requirements AS/EN/SJAC 9104.
CURRENT
2017-04-11
Standard
AS6174/1
To assure compliance to AS6174A requirements, a set of standard assessment verification criteria is utilized to evaluate and establish uniform compliance assessment. This document standardizes verification compliance criteria for AS6174A requirements.
CURRENT
2017-02-08
Standard
TS200AR-44
No Scope available.
2017-02-01
WIP Standard
AS6171/4A
This method standardizes inspection, test procedures and minimum training and certification requirements to detect Suspect/Counterfeit (SC) Electrical, Electronic, and Electromechanical (EEE) components or parts utilizing Delid/Decapsulation Physical Analysis. The methods described in this document are employed to either delid or remove the cover from a hermetically sealed package or to remove the encapsulation or coating of an EEE part, in order to examine the internal structure and to determine if the part is suspect counterfeit. Information obtained from this inspection and analysis may be used to: a. prevent inclusion of counterfeit parts in the assembly b. identify defective parts c. aid in disposition of parts that exhibit anomalies This test method should not be confused with Destructive Physical Analysis as defined in MIL-STD-1580. MIL-STD-1580 describes destructive physical analysis procedures for inspection and interpretation of quality issues.
2017-01-18
WIP Standard
AS5553C
This standard is for use by organizations that procure and/or integrate EEE parts and/or assemblies containing such items. The requirements of this standard are generic and intended to be applied/flowed down, as applicable, through the supply chain to all organizations that procure EEE parts and/or assemblies, regardless of type, size, and product provided. The mitigation of counterfeit EEE parts in this standard is risk-based and these mitigation steps will vary depending on the application, desired performance, and reliability of the equipment/hardware. The requirements of this document are intended to supplement the requirements of a higher level quality standard (e.g., AS/EN/JISQ9100, ISO-9001, ANSI/ASQC E4, ASME NQA-1, AS9120, AS9003, and ISO/TS 16949 or equivalent) and other quality management system documents.
2016-12-09
WIP Standard
AS6171/20
To define capabilities and limitations of X-Ray Photoelectron Spectroscopy (XPS) as it pertains to detection of suspect/counterfeit EEE parts and suggest possible applications to these ends. Additionally, this document outlines requirements associated with the application of XPS including: operator training and requirements; sample preparation; data interpretation; and data reporting procedures.
2016-12-09
WIP Standard
AS6171/19
This document defines capabilities and limitations of Auger Electron Spectroscopy (AES) as it pertains to detection of suspect/counterfeit EEE parts and suggests possible applications to these ends. Additionally, this document outlines requirements associated with the application of AES including: operator training and requirements; sample preparation; data interpretation and reporting of data.
2016-12-09
WIP Standard
AS6171/21
This document defines capabilities and limitations of Gas Chromatography/Mass Spectrometry (GC/MS) as it pertains to detection of suspect/counterfeit EEE parts and suggests possible applications to these ends. Additionally, this document outlines requirements associated with the application of GC/MS including: operator training; sample preparation; various sampling techniques; data interpretation; computerized spectral matching; equipment maintenance; and reporting of data. The discussion is limited to unit mass resolution spectrometers such as quadrupole systems and electron impact ionization.
2016-12-09
WIP Standard
AS6171/18
This test method provides the capabilities, limitations, and suggested possible applications of TMA as it pertains to detection of suspect/counterfeit EEE parts. Additionally, this document outlines requirements associated with the application of TMA including: equipment requirements, test sample requirements, methodology, control and calibration, data analysis, reporting, and qualification and certification.
CURRENT
2016-11-22
Standard
AMS2817G
This specification covers procedures which will provide protection of elastomeric seals and seal assemblies such as O-rings, cap seal assemblies, and other designs from contamination by foreign materials and handling / transportation / storage damage prior to installation and ensure positive identification by part number of each piece until it is installed.
CURRENT
2016-10-30
Standard
AS6171/9
This document defines capabilities and limitations of FTIR spectroscopy as it pertains to counterfeit electronic component detection and suggests possible applications to these ends. Additionally, this document outlines requirements associated with the application of FTIR spectroscopy including: operator training, sample preparation, various sampling techniques, data interpretation, computerized spectral matching including pass/fail criteria, equipment maintenance, and reporting of data. The discussion is primarily aimed at analyses performed in the mid-infrared (IR) from 400 to 4000 wavenumbers; however, many of the concepts are applicable to the near and far IR. If AS6171/9 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
CURRENT
2016-10-30
Standard
AS6171/6
Through the use of ultra-high frequency ultrasound, typically above 10 MHz, Acoustic Microscopy (AM) non-destructively finds and characterizes physical features and latent defects (visualization of interior features in a layer by layer process) - such as material continuity and discontinuities, sub-surface flaws, cracks, voids, delaminations and porosity. AM observed features and defects can be indicators that the components were improperly handled, stored, altered or previously used. If AS6171/6 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
CURRENT
2016-10-30
Standard
AS6171/11
This method outlines the requirements, capabilities, and limitations associated with the application of Design Recovery for the detection of counterfeit electronic parts including: Operator training; Sample preparation; Imaging techniques; Data interpretation; Design/functional matching; Equipment maintenance and; Reporting of data. The method is primarily aimed at analyses performed by circuit delayering and imaging with a scanning electron microscope or optical microscope; however, many of the concepts are applicable to other microscope and probing techniques to recover design data. The method is not intended for the purpose of manufacturing copies of a device, but rather to compare images or recover the design for determination of authenticity. If AS6171/11 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
CURRENT
2016-10-30
Standard
AS6171/8
To define capabilities and limitations of Raman spectroscopy as it pertains to counterfeit detection of EEE parts and suggest possible applications to these ends. Additionally, this document outlines requirements associated with the application of Raman spectroscopy including: Operator training; Sample preparation; Data interpretation; Computerized spectral matching including pass/fail criteria; Equipment maintenance and; Reporting of data. If AS6171/8 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
CURRENT
2016-10-30
Standard
AS6171/10
This test method provides the capabilities, limitations, and suggested possible applications of TGA as it pertains to the detection of counterfeit electronic components. Additionally, this document outlines requirements associated with the application of TGA including: equipment requirements, test sample requirements, methodology, control and calibration, data analysis, reporting, and qualification and certification. If AS6171/10 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
CURRENT
2016-10-30
Standard
AS6171/7
The scope of this document is to: Specify techniques to detect SC parts using electrical testing. Provide various levels of electrical testing that can be used by the User to define test plans for detecting SC parts. Provide minimum requirements for testing laboratories so that User/Requester can determine which test houses have the necessary capabilities. (For example: technical knowledge, equipment, procedures and protocols for performing electrical testing for verification analysis.) Note: User/Requester is defined in AS6171 General Requirements Specify Burn-In and environmental tests. The environmental tests include Temperature Cycling for Active Devices and Thermal Shock for Passive Devices. Seal Tests are described and recommended for hermetic devices. The following terminology is used throughout this document: Shall = is mandatory; Should = is recommended; and Will = is planned (is considered to be part of a standard process).
CURRENT
2016-10-30
Standard
AS6171/5
The intent of this document is to define the methodology for suspect parts inspection using radiological inspection. The purpose of radiology for suspect counterfeit part inspection is to detect deliberate misrepresentation of a part, either at the part distributor or original equipment manufacturer (OEM) level. Radiological inspection can also potentially detect unintentional damage to the part resulting from improper removal of part from assemblies, which may include, but not limited to, prolonged elevated temperature exposure during desoldering operations or mechanical stresses during removal. Radiological inspection of electronics includes film radiography and filmless radiography such as digital radiography (DR), real time radiography (RTR), and computed tomography (CT). Radiology is an important tool used in part verification of microelectronic devices.
CURRENT
2016-10-30
Standard
AS6171/4
This method standardizes inspection, test procedures and minimum training and certification requirements to detect Suspect/Counterfeit (SC) Electrical, Electronic, and Electromechanical (EEE) components or parts utilizing Delid/Decapsulation Physical Analysis. The methods described in this document are employed to either delid or remove the cover from a hermetically sealed package or to remove the encapsulation or coating of an EEE part, in order to examine the internal structure and to determine if the part is suspect counterfeit. Information obtained from this inspection and analysis may be used to: prevent inclusion of counterfeit parts in the assembly identify defective parts aid in disposition of parts that exhibit anomalies This test method should not be confused with Destructive Physical Analysis as defined in MIL-STD-1580. MIL-STD-1580 describes destructive physical analysis procedures for inspection and interpretation of quality issues.
CURRENT
2016-10-30
Standard
AS6171/3
XRF technique for counterfeit detection is applicable to electrical, electronic and electromechanical (EEE) parts as listed in AS6171 General Requirements. In general, the detection technique is meant for use on piece parts prior to assembly on a circuit board or on the parts that are removed from a circuit board. The applicability spans a large swath of active, passive and electromechanical parts. If AS6171/3 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
CURRENT
2016-10-30
Standard
AS6171/1
This document describes an assessment of the effectiveness of a specified test plan used to screen for counterfeit parts. The assessment includes the determination of the types of defects detected using a specified test plan along with the related counterfeit type coverage. The output of this evaluation will produce Counterfeit Defect Coverage (CDC), Counterfeit Type Coverage (CTC), Not-Covered Defects (NCDs), and Under-Covered Defects (UCDs). This information will be supplied to the test laboratory’s customer in both the test report and the Certificate of Quality Conformance (CoQC). This evaluation method does not address the effectiveness of detecting tampered type devices. The Test Evaluation Method also describes an Optimized Test Sequence Selection, in which a test sequence is selected that maximizes the CDC utilizing test cost and time as constraints, for any tier level except the Critical Risk Level. The constraints can be adjusted until the desired CDC is achieved.
HISTORICAL
2016-10-30
Standard
AS6171/2
This document describes the requirements of the following test methods for counterfeit detection of electronic components: Method A: General External Visual Inspection (EVI), Sample Selection, and Handling Method B: Detailed EVI Method C: Testing for Remarking and Resurfacing Method D: Surface Texture Analysis by SEM
CURRENT
2016-10-30
Standard
AS6171
This SAE Aerospace Standard (AS) standardizes inspection and test procedures, workmanship criteria, and minimum training and certification requirements to detect Suspect/Counterfeit (SC) Electrical, Electronic, and Electromechanical (EEE) parts. The requirements of this document apply once a decision is made to use parts with unknown chain of custody that do not have pedigree back to the original component manufacturer, or have been acquired from a broker or independent distributor, or when there are other known risk elements that result in the User/Requester to have concerns about potential SC EEE parts. The tests specified by this standard may also detect occurrences of malicious tampering, although the current version of this standard is not designed specifically for this purpose. This standard ensures consistency across the supply chain for test techniques and requirements based on assessed risk associated with the application, component, supplier, and other relevant risk factors.
2016-10-03
WIP Standard
AS6462B
This set of criteria shall be utilized by accredited Certification Bodies (CBs) to establish compliance, and grant certification to AS5553A, Aerospace Standard; Counterfeit Electronic Parts; Avoidance, Detection, Mitigation, and Disposition.
2016-09-29
WIP Standard
ARP6328A

This document contains guidance for implementing a counterfeit mitigation program in accordance with AS5553.

The information contained in this document is intended to supplement the requirements of a higher level quality standard (e.g., AS9100) and other quality management system documents. This is not intended to stand alone, supersede, or cancel requirements found in other quality management system documents, requirements imposed by contracting authorities, or applicable laws and regulations unless an authorized exemption/variance has been obtained.

CURRENT
2016-09-12
Standard
ARP6328
This document contains guidance for implementing a counterfeit mitigation program in accordance with AS5553. The information contained in this document is intended to supplement the requirements of a higher level quality standard (e.g., AS9100) and other quality management system documents. This is not intended to stand alone, supersede, or cancel requirements found in other quality management system documents, requirements imposed by contracting authorities, or applicable laws and regulations unless an authorized exemption/variance has been obtained.
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